The characterization of electronic components under the influence of various types of irradiation is of particular importance nowadays. Accurate characterization enables the development of models to design novel protection mechanisms against radiation effects. The sensitivity of an electronic component strongly depends on the dimensioning as well as the manufacturing process. Modern integrated circuits, which are available in smaller and smaller structure sizes due to the progressing miniaturization, become more and more sensitive to irradiation. Therefore, there is an increasing need to perform characterization and modeling of such technologies in order to develop efficiently implemented robust electronics. In this project, different digital integrated circuit types (FPGAs, application specific ICs and standard ICs) will be characterized and modeled in different technologies. For this purpose, three different irradiation sources will be used (neutron generator, gamma flash facility, Co-60 source). Subsequently, an exemplary protection mechanism will be developed, implemented and experimentally validated using the developed models for an FPGA.
Lead: Prof. Dr.-Ing. Guillermo Payá Vayá
Running Time: 09.2022 - 07.2025